Structural analysis of amorphous carbon films by spectroscopic ellipsometry, RBS/ERDA, and NEXAFS
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چکیده
منابع مشابه
Electronic and Structural Properties of Molybdenum Thin Films as Determined by Real Time Spectroscopic Ellipsometry
This Article is brought to you for free and open access by the Electrical & Computer Engineering at ODU Digital Commons. It has been accepted for inclusion in Electrical & Computer Engineering Faculty Publications by an authorized administrator of ODU Digital Commons. For more information, please contact [email protected]. Repository Citation Walker, J. D.; Khatri, H.; Ranjan, V.; Li, Jian...
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ژورنال
عنوان ژورنال: Applied Physics Letters
سال: 2017
ISSN: 0003-6951,1077-3118
DOI: 10.1063/1.4983643